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Results 1 - 20 of 5,606  for Central Connecticut State University

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1
Logic non-volatile memory : the NVM solutions from eMemory
Material Type:
Book
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Logic non-volatile memory : the NVM solutions from eMemory

Hsu, Charles Ching-Hsiang, author. ;Hsu, Charles Ching-Hsiang.

New Jersey : World Scientific [2014]

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2
Dynamic semiconductor RAM structures : a patent-oriented survey
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Book
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Dynamic semiconductor RAM structures : a patent-oriented survey

Cardon, A. ;Fransen, L. J. L.

McLean, VA, USA : Pergamon International Information Corp. ; Oxford Oxfordshire ; New York : Pergamon Press 1984

Available at Central Connecticut State University  Stack Level 6  (TK7895 M4 C37 1984 )()

3
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Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author ;Rajsuman, Rochit Contributor

Place of publication not identified IEEE Computer Society 2000

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4
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Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author ;Rajsuman, Rochit Contributor

Place of publication not identified IEEE Computer Society Press 1995

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5
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Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author ;Wik, T Contributor

Place of publication not identified IEEE Computer Society 2002

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6
2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
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Book
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2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author ;Guo li qing hua da xue (Hsinchu, Taiwan) Content Provider

Place of publication not identified IEEE Computer Society 2005

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7
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
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Book
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2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author ;IEEE Computer Society Technical Council on Test Technology. Content Provider

Place of publication not identified IEEE Computer Society 2006

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8
MTDT 2009 : 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan
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Book
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MTDT 2009 : 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author ;IEEE Computer Society Content Provider

Place of publication not identified IEEE Computer Society 2009

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9
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Book
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MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author ;Rajsuman, Rochit Contributor

Place of publication not identified IEEE Computer Society 2004

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10
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Memory Technology, Design and Testing, 1997: IEEE International Workshop on (MTDT '97).

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author ;Rajsuman, Rochit Contributor

Place of publication not identified IEEE Computer Society Press 1997

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11
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Book
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Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author ;Rajsuman, Rochit Contributor

Place of publication not identified IEEE Computer Society 2003

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12
Material Type:
Article
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Perpendicular magnetic tunnel junctions with double barrier and single or synthetic antiferromagnetic storage layer

Cuchet, Léa ; Rodmacq, Bernard ; Auffret, Stephane ; Sousa, Ricardo C ; Prejbeanu, Ioan L ; Dieny, Bernard

Journal of Applied Physics, 2015, Vol.117(23), p.233901 [Peer Reviewed Journal]

Full text available online

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13
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Article
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Technical Perspectives: Proving File Systems Meet Expectations

Heiser, Gernot

Association for Computing Machinery. Communications of the ACM, Apr 2017, p.74 [Peer Reviewed Journal]

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14
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Article
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Low switching-threshold-voltage zinc oxide nanowire array resistive random access memory

Shen, Guan-Hung ; Tandio, Andrew Ronaldi ; Lin, Mei-Yu ; Lin, Gao-Feng ; Chen, Kai-Huang ; Hong, Franklin Chau-Nan

Thin Solid Films, 01 November 2016, Vol.618, pp.90-94 [Peer Reviewed Journal]

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15
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Phase change memory based on SnSe4 alloy

Karanja, J.M ; Karimi, P.M ; Njoroge, W.K ; Wamwangi, D.M

Thin Solid Films, 01 January 2013, Vol.527, pp.323-326 [Peer Reviewed Journal]

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16
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Memory properties of (110) preferring oriented CH3NH3PbI3 perovskite film prepared using PbS-buffered three-step growth method

Wu, Hsuan-Ta ; Chen, Yung-Fu ; Shih, Chuan-Feng ; Leu, Ching-Chich ; Wu, Shih-Hsiung

Thin Solid Films, 30 August 2018, Vol.660, pp.320-327 [Peer Reviewed Journal]

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17
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Manganite based memristors: Influence of the electroforming polarity on the electrical behavior and radiation hardness

Rubi, D ; Kalstein, A ; Román, W.S ; Ghenzi, N ; Quinteros, C ; Mangano, E ; Granell, P ; Golmar, F ; Marlasca, F.G ; Suarez, S ; Bernardi, G ; Albornoz, C ; Leyva, A.G ; Levy, P

Thin Solid Films, 29 May 2015, Vol.583, pp.76-80 [Peer Reviewed Journal]

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18
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Endurance improvement and resistance stabilization of transparent multilayer resistance switching devices with oxygen deficient WOx layer and heat dissipating AlN buffer layer

Lin, Yu-Hsuan ; Huang, Ding-Chiuan ; Lou, Jen-Chung ; Tseng, Tseung-Yuen

Thin Solid Films, 31 December 2017, Vol.644, pp.10-15 [Peer Reviewed Journal]

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19
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Solution-processed ZnO thin films for low voltage and low temperature application in flexible resistive random access memory

You, Hsin-Chiang ; Lin, Gong-Kai

Thin Solid Films, 01 October 2016, Vol.616, pp.728-732 [Peer Reviewed Journal]

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20
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Forming time of conducting channels in double-layer Pt/Ta2O5/TaOx/Pt and single-layer Pt/TaOx/Pt resistance memories

Yoo, H.K ; Kang, B.S ; Lee, S.B

Thin Solid Films, 01 July 2013, Vol.540, pp.190-193 [Peer Reviewed Journal]

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