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Results 1 - 20 of 456  for Central Connecticut State University

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1
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Comment Cambridge Analytica a repéré les électeurs de Trump grâce à leurs vêtements

Rousset, Alexandre

Les Echos, Nov 30, 2018

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Vague de départs et tensions internes au sein de la France insoumise

Rousset, Alexandre

Les Echos, Nov 28, 2018

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3
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Newspaper Article
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Migrants : Paris et Madrid renforcent leur coopération

Rousset, Alexandre

Les Echos, Nov 13, 2018

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4
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Newspaper Article
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Quelles études faut-il faire pour devenir ministre ?

Rousset, Alexandre

Les Echos, Nov 18, 2018

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5
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Newspaper Article
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L'arrivée d'Amazon à New York dénoncée par certains élus

Rousset, Alexandre

Les Echos, Nov 14, 2018

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6
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Newspaper Article
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La presse étrangère effarée par les violences à Paris

Rousset, Alexandre

Les Echos, Dec 2, 2018

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7
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Newspaper Article
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Européennes : La République en Marche cherche des candidates

Rousset, Alexandre

Les Echos, Nov 13, 2018

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8
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Newspaper Article
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Macron a pu compter sur de très généreux donateurs lors de l'élection présidentielle

Rousset, Alexandre

Les Echos, Dec 2, 2018

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9
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Newspaper Article
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L'armée américaine se lance dans le e-sport pour draguer les jeunes

Rousset, Alexandre

Les Echos, Nov 17, 2018

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10
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Après les supérettes, Amazon veut ouvrir des hypermarchés sans caisses

Rousset, Alexandre

Les Echos, Dec 3, 2018

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11
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Newspaper Article
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Les voitures autonomes d'Uber prêtes à reprendre la route

Rousset, Alexandre

Les Echos, Nov 5, 2018

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12
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Newspaper Article
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General Motors lance une restructuration massive

Feitz, Anne ; Rousset, Alexandre

Les Echos, Nov 27, 2018

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13
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General Motors lance une restructuration massive

Feitz, Anne ; Rousset, Alexandre

Les Echos, Nov 26, 2018

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14
Failure diagnosis in the logic circuits : Development of a method targeting an enlarged set of fault models
Material Type:
Dissertation
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Failure diagnosis in the logic circuits : Development of a method targeting an enlarged set of fault models

Rousset, Alexandre ;Rousset, Alexandte (Editor)

01 April 2008

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15
Material Type:
Conference Proceeding
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Improved Diagnosis Resolution without Physical Information

Bosio, Alberto ; Rousset, Alexandre ; Girard, Patrick ; Pravossoudovitch, Serge ; Landrault, Christian ; Virazel, Arnaud ;Bosio, Alberto (Editor)

DELTA'08: International Symposium on Electronic Design, Test & Applications, 23 January 2008, pp.210-215

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16
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Conference Proceeding
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DERRIC: A Tool for Unified Logic Diagnosis

Bosio, Alberto ; Girard, Patrick ; Landrault, Christian ; Pravossoudovitch, Serge ; Rousset, Alexandre ; Virazel, Arnaud ;Peridier, Martine (Editor)

12th IEEE European Test Symposium, 2007, pp.13-18

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17
Material Type:
Conference Proceeding
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A Mixed Approach for Unified Logic Diagnosis

Rousset, Alexandre ; Bosio, Alberto ; Girard, Patrick ; Landrault, Christian ; Pravossoudovitch, Serge ; Virazel, Arnaud ;Peridier, Martine (Editor)

DDECS'07: IEEE Design and Diagnostics of Electronic Circuits and Systems, 2007, pp.239-242

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18
Material Type:
Conference Proceeding
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Méthode de diagnostic unifiée pour circuits intégrés numériques

Rousset, Alexandre ; Bosio, Alberto ; Girard, Patrick ; Landrault, Christian ; Pravossoudovitch, Serge ; Virazel, Arnaud ;Virazel, Arnaud (Editor)

Colloque du GDR SoC-SiP, 2007

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19
Material Type:
Conference Proceeding
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Fast Bridging Fault Diagnosis using Logic Information

Rousset, Alexandre ; Bosio, Alberto ; Girard, Patrick ; Landrault, Christian ; Pravossoudovitch, Serge ; Virazel, Arnaud ;Peridier, Martine (Editor)

16th IEEE Asian Test Symposium, 08 October 2007, pp.33-38

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20
Material Type:
Conference Proceeding
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Unified Framework for Logic Diagnosis

Rousset, Alexandre ; Girard, Patrick ; Landrault, Christian ; Pravossoudovitch, Serge ; Virazel, Arnaud ;Peridier, Martine (Editor)

EWDTW: East-West Design & Test Workshop, 2006, pp.47-52

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